MSE-735 / 1 crédit

Enseignant(s): Cantoni Marco, Various lecturers (see below), Alexander Duncan, Oveisi Emadeddin, Boureau Victor Carle Adrien

Langue: Anglais

Remark: Next time 13-15.09.2021


Frequency

Every 2 years

Summary

This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM.

Content

Keywords

Transmission electron microscopy, EDX analysis, EELS

 

Learning Prerequisites

Recommended courses

Doctoral school "Transmission electron microscopy and diffraction"

Resources

Websites

Dans les plans d'études

  • Nombre de places: 30
  • Forme de l'examen: Exposé (session libre)
  • Matière examinée: Scanning and Analytical Transmission Electron Microscopy
  • Cours: 11 Heure(s)
  • Exercices: 4 Heure(s)
  • TP: 3 Heure(s)

Semaine de référence