MSE-735 / 1 credit

Teacher(s): Cantoni Marco, Various lecturers (see below), Alexander Duncan, Oveisi Emadeddin, Boureau Victor Carle Adrien

Language: English

Remark: Next time 13-15.09.2021


Frequency

Every 2 years

Summary

This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM.

Content

Keywords

Transmission electron microscopy, EDX analysis, EELS

 

Learning Prerequisites

Recommended courses

Doctoral school "Transmission electron microscopy and diffraction"

Resources

Websites

In the programs

  • Number of places: 30
  • Exam form: Oral presentation (session free)
  • Subject examined: Scanning and Analytical Transmission Electron Microscopy
  • Lecture: 11 Hour(s)
  • Exercises: 4 Hour(s)
  • Practical work: 3 Hour(s)

Reference week