MSE-735 / 1 credit

Teacher(s): Stadelmann Pierre, Cantoni Marco, Alexander Duncan, Oveisi Emadeddin, Boureau Victor Carle Adrien

Language: English

Remark: Next time 13-15.09.2021


Every 2 years


This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM.



Transmission electron microscopy, EDX analysis, EELS


Learning Prerequisites

Recommended courses

Doctoral school "Transmission electron microscopy and diffraction"



In the programs

  • Number of places: 30
  • Exam form: Oral presentation (session free)
  • Subject examined: Scanning and Analytical Transmission Electron Microscopy
  • Lecture: 11 Hour(s)
  • Exercises: 3 Hour(s)
  • Practical work: 8 Hour(s)

Reference week