MSE-715 / 2 crédits

Enseignant(s): Cantoni Marco, Alexander Duncan, Oveisi Emadeddin, Invited lecturers (see below), Boureau Victor Carle Adrien

Langue: Anglais


Frequency

Every 2 years

Summary

Lectures as well as hands-on trainings concerning different STEM imaging and spectroscopy techniques. Fundamentals of STEM, basic and advanced STEM imaging (ABF, ADF, iDPC, and 4D STEM), aberration-corrected STEM imaging and simulation, acquisition and analysis of EELS and EDX data.

Content

Keywords

STEM theory and instrumentation, STEM imaging modes, Aberration-corrected STEM, Quantitative STEM, STEM image simulation, EELS: basic principles, data acquisition and processing, EDX: basic principles, data acquisition and processing, HyperSpy, independent component analysis.

Learning Prerequisites

Required courses

MSE-637 or equivalent

Assessment methods

Oral exam

Resources

Websites

Dans les plans d'études

  • Nombre de places: 30
  • Forme de l'examen: Oral (session libre)
  • Matière examinée: Fundamentals of STEM lmaging and Spectroscopy
  • Cours: 18 Heure(s)
  • TP: 18 Heure(s)

Semaine de référence