MSE-715 / 2 credits

Teacher(s): Cantoni Marco, Alexander Duncan, Oveisi Emadeddin, Invited lecturers (see below), Boureau Victor Carle Adrien

Language: English


Frequency

Every 2 years

Summary

Lectures as well as hands-on trainings concerning different STEM imaging and spectroscopy techniques. Fundamentals of STEM, basic and advanced STEM imaging (ABF, ADF, iDPC, and 4D STEM), aberration-corrected STEM imaging and simulation, acquisition and analysis of EELS and EDX data.

Content

Keywords

STEM theory and instrumentation, STEM imaging modes, Aberration-corrected STEM, Quantitative STEM, STEM image simulation, EELS: basic principles, data acquisition and processing, EDX: basic principles, data acquisition and processing, HyperSpy, independent component analysis.

Learning Prerequisites

Required courses

MSE-637 or equivalent

Assessment methods

Oral exam

Resources

Websites

In the programs

  • Number of places: 30
  • Exam form: Oral (session free)
  • Subject examined: Fundamentals of STEM lmaging and Spectroscopy
  • Lecture: 18 Hour(s)
  • Practical work: 18 Hour(s)

Reference week