MSE-628 / 1 crédit

Enseignant(s): Dommann Alex, Neels Antonia

Langue: Anglais

Remark: Next time: 24 - 26 November, 2021 (the course will be given only if the sanitary situation allows to be in person)


Frequency

Every 2 years

Summary

After introducing thin film and HR-XRD characterisation methods, theory and limitations are discussed, including examples and how the film structure influences its characteristics. Protocols are presented for establishing reproducible and reliable measurements, and for interpreting their results.

Content

Dans les plans d'études

  • Nombre de places: 16
  • Forme de l'examen: Ecrit (session libre)
  • Matière examinée: CCMX Advanced Course - Advanced X-ray Diffraction Methods for Coatings: strain, defects and deformation analysis of thin films
  • Cours: 13 Heure(s)
  • TP: 5 Heure(s)

Semaine de référence