CCMX Advanced Course - Advanced X-ray Diffraction Methods for Coatings: strain, defects and deformation analysis of thin films
MSE-628 / 1 credit
Teacher(s): Dommann Alex, Neels Antonia
Language: English
Remark: Next time: 2025
Frequency
Every 2 years
Summary
After introducing thin film and HR-XRD characterisation methods, theory and limitations are discussed, including examples and how the film structure influences its characteristics. Protocols are presented for establishing reproducible and reliable measurements, and for interpreting their results.
Content
Please find information on the link below : https://www.epfl.ch/research/domains/ccmx/courses-and-events/axrd23/
In the programs
- Number of places: 16
- Exam form: Written (session free)
- Subject examined: CCMX Advanced Course - Advanced X-ray Diffraction Methods for Coatings: strain, defects and deformation analysis of thin films
- Lecture: 13 Hour(s)
- Practical work: 5 Hour(s)
- Type: optional