CH-633 / 2 crédits

Enseignant(s): Mensi Mounir Driss, Oveisi Emadeddin, Schouwink Pascal Alexander

Langue: Anglais

Remark: Next time: Spring 2021


Frequency

Every 2 years

Summary

State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM).

Content

Keywords

Surfaces and solid state characterization, X-ray scattering (GIWAXS, GISAXS),      

spectroscopy (XPS, AES, Raman), microscopy (AFM, TERS, SEM, TEM)

Learning Outcomes

By the end of the course, the student must be able to:

  • Distinguish broad overview of state-of-the-art methods,choosing and designing method and experiment purposefully

Assessment methods

Written

Dans les plans d'études

  • Nombre de places: 20
  • Forme de l'examen: Oral (session libre)
  • Matière examinée: Advanced Solid State and Surface Characterization
  • Cours: 28 Heure(s)

Semaine de référence