CH-633 / 2 credits

Teacher(s): Mensi Mounir Driss, Oveisi Emadeddin, Schouwink Pascal Alexander

Language: English

Remark: Next time: Spring 2024


Every year


State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM).



Surfaces and solid state characterization, X-ray scattering (GIWAXS, GISAXS),      

spectroscopy (XPS, AES, Raman), microscopy (AFM, TERS, SEM, TEM)

Learning Outcomes

By the end of the course, the student must be able to:

  • Distinguish broad overview of state-of-the-art methods,choosing and designing method and experiment purposefully

Assessment methods

2021: via moodle

In the programs

  • Number of places: 20
  • Exam form: Oral (session free)
  • Subject examined: Advanced Solid State and Surface Characterization
  • Lecture: 28 Hour(s)
  • Type: optional

Reference week

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