21Intro Scanning electron microscopy techniques
Frequency
Every 2 years
Summary
Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multimodal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work.
Content
The following subjects will be presented during the course:
- Basics of the scanning electron microscopy and focused ion beam instruments (construction principles, signals, interaction with the sample)
- Advanced imaging modes: STEM, low tension microscopy, high vacuum, ion channeling
- Advanced microstructure investigation with EBSD and transmission EBSD orientation mapping (EBSD strain and stress analyses with cross correlation technique)
- Chemical analyses with EDS, WDS and Ό-XRF
- Chemical depth profile with FIB-TOF-SIMS
- Raman spectrometry for phase and strain/stress analyses
The techniques will be explored in small groups on real samples in front of SEMs
Note
This course is open to participants with a basic background in materials science, mechanical engineering, chemical engineering, micro-technology or physics.
Keywords
Scanning Electron Microscopy; microanalysis, multimodal imaging, analytical methods, chemical analysis
Dans les plans d'études
- Nombre de places: 16
- Forme de l'examen: Ecrit (session libre)
- Matière examinée: 21Intro Scanning electron microscopy techniques
- Cours: 15 Heure(s)
- Exercices: 3 Heure(s)