MSE-609 / 1 crédit

Enseignant(s): Michler Johann, Maeder Xavier

Langue: Anglais


Every 2 years


Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multimodal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work.



This course is open to participants with a basic background in materials science, mechanical engineering, chemical engineering, micro-technology or physics.


Scanning Electron Microscopy; microanalysis, multimodal imaging, analytical methods, chemical analysis

Dans les plans d'études

  • Nombre de places: 16
  • Forme de l'examen: Ecrit (session libre)
  • Matière examinée: 21Intro Scanning electron microscopy techniques
  • Cours: 15 Heure(s)
  • Exercices: 3 Heure(s)

Semaine de référence