MSE-609 / 1 crédit

Enseignant(s): Michler Johann, Maeder Xavier

Langue: Anglais


Frequency

Every 2 years

Summary

Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multimodal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work.

Content

Note

This course is open to participants with a basic background in materials science, mechanical engineering, chemical engineering, micro-technology or physics.

Keywords

Scanning Electron Microscopy; microanalysis, multimodal imaging, analytical methods, chemical analysis

Dans les plans d'études

  • Nombre de places: 16
  • Forme de l'examen: Ecrit (session libre)
  • Matière examinée: 21Intro Scanning electron microscopy techniques
  • Cours: 15 Heure(s)
  • Exercices: 3 Heure(s)

Semaine de référence