MSE-609 / 1 crédit

Enseignant(s): Michler Johann, Maeder Xavier

Langue: Anglais

Remark: Next time : 2023


Frequency

Every 2 years

Summary

Modern Scanning Electron Microscopes, when combined with Focused Ion Beams (Dual beam FIB-SEM), provide a larger number of multimodal imaging and analysis/characterisation modes at the nano- and micron-scales. The aim of the course is to present the extended analytical possibilities of such device.

Content

Note

This course is open to participants with a basic background in materials science, mechanical engineering, chemical engineering, micro-technology or physics, from both industry and academia.

Keywords

Scanning Electron Microscopy, Focuss Ion Beam, Transmission Electron Microscopy, microanalysis, multimodal imaging, analytical methods, chemical analysis

Learning Prerequisites

Required courses

None

Recommended courses

The course is recommended for every student and scientist using analytical FIB-SEM devices for their work.

Teaching methods

Theory through power point presentations and parctical teaching in front of the devices in small groups for a more targeted teaching.

Dans les plans d'études

  • Nombre de places: 16
  • Forme de l'examen: Ecrit (session libre)
  • Matière examinée: 21Intro Scanning electron microscopy techniques
  • Cours: 15 Heure(s)
  • Exercices: 3 Heure(s)

Semaine de référence