MSE-609 / 1 credit

Teacher(s): Michler Johann, Maeder Xavier

Language: English


Frequency

Every 2 years

Summary

Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multimodal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work.

Content

Note

This course is open to participants with a basic background in materials science, mechanical engineering, chemical engineering, micro-technology or physics.

Keywords

Scanning Electron Microscopy; microanalysis, multimodal imaging, analytical methods, chemical analysis

In the programs

  • Number of places: 16
  • Exam form: Written (session free)
  • Subject examined: 21Intro Scanning electron microscopy techniques
  • Lecture: 15 Hour(s)
  • Exercises: 3 Hour(s)

Reference week