MSE-609 / 1 credit

Teacher(s): Michler Johann, Maeder Xavier

Language: English


Every 2 years


Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multimodal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work.



This course is open to participants with a basic background in materials science, mechanical engineering, chemical engineering, micro-technology or physics.


Scanning Electron Microscopy; microanalysis, multimodal imaging, analytical methods, chemical analysis

In the programs

  • Number of places: 16
  • Exam form: Written (session free)
  • Subject examined: 21Intro Scanning electron microscopy techniques
  • Lecture: 15 Hour(s)
  • Exercises: 3 Hour(s)

Reference week