Physical and chemical analyses of materials
Summary
The course relates on the use of electromagnetic (X-Ray) and corpuscular (electrons) radiations for physical and chemical analysis of solid materials.
Content
1. Fundamentals of beam interactions with materials
- Matter excitation: elastic, inelastic interactions of X-ray photons and electrons with matter
- Matter relaxation: spectrometry
2. Microscopy
- Electron microscopy: Scanning and Transmission Electron Microscopies
- Scanning probe microscopy: Scanning Tunelling and Atomic Force Microscopies
3. Chemical analysis
- Bulk analysis of materials: X-ray microanalysis and X-ray Fluorescence Spectrometries
- Surface analysis of materials: X-Ray Photoelectron and Auger Electron Spectrometries
4. Chemiometry
- Basics of statistics
- Analyses of variance ANOVA
Assessment methods
Final written exam
Supervision
Office hours | No |
Assistants | No |
Others | Questions to the teacher during the course |
In the programs
- Semester: Spring
- Exam form: Written (summer session)
- Subject examined: Physical and chemical analyses of materials
- Courses: 2 Hour(s) per week x 14 weeks
- Type: optional
- Semester: Spring
- Exam form: Written (summer session)
- Subject examined: Physical and chemical analyses of materials
- Courses: 2 Hour(s) per week x 14 weeks
- Type: optional
- Semester: Spring
- Exam form: Written (summer session)
- Subject examined: Physical and chemical analyses of materials
- Courses: 2 Hour(s) per week x 14 weeks
- Type: optional
- Semester: Spring
- Exam form: Written (summer session)
- Subject examined: Physical and chemical analyses of materials
- Courses: 2 Hour(s) per week x 14 weeks
- Type: optional
Reference week
Mo | Tu | We | Th | Fr | |
8-9 | |||||
9-10 | |||||
10-11 | |||||
11-12 | |||||
12-13 | |||||
13-14 | |||||
14-15 | |||||
15-16 | |||||
16-17 | CHB330 | ||||
17-18 | |||||
18-19 | |||||
19-20 | |||||
20-21 | |||||
21-22 |