CH-410 / 3 credits

Teacher: Roussel Christophe

Language: English


Summary

The course relates on the use of electromagnetic (X-Ray) and corpuscular (electrons) radiations for physical and chemical analysis of solid materials.

Content

1. Fundamentals of beam interactions with materials

  • Matter excitation: elastic, inelastic interactions of X-ray photons and electrons with matter
  • Matter relaxation: spectrometry

2. Microscopy

  • Electron microscopy: Scanning and Transmission Electron Microscopies
  • Scanning probe microscopy: Scanning Tunelling and Atomic Force Microscopies

3. Chemical analysis

  • Bulk analysis of materials: X-ray microanalysis and X-ray Fluorescence Spectrometries
  • Surface analysis of materials: X-Ray Photoelectron and Auger Electron Spectrometries

4. Chemiometry

  • Basics of statistics
  • Analyses of variance ANOVA

 

Assessment methods

Final written exam

Supervision

Office hours No
Assistants No
Others Questions to the teacher during the course

Resources

Moodle Link

In the programs

  • Semester: Spring
  • Exam form: Written (summer session)
  • Subject examined: Physical and chemical analyses of materials
  • Courses: 2 Hour(s) per week x 14 weeks
  • Type: optional
  • Semester: Spring
  • Exam form: Written (summer session)
  • Subject examined: Physical and chemical analyses of materials
  • Courses: 2 Hour(s) per week x 14 weeks
  • Type: optional
  • Semester: Spring
  • Exam form: Written (summer session)
  • Subject examined: Physical and chemical analyses of materials
  • Courses: 2 Hour(s) per week x 14 weeks
  • Type: optional
  • Semester: Spring
  • Exam form: Written (summer session)
  • Subject examined: Physical and chemical analyses of materials
  • Courses: 2 Hour(s) per week x 14 weeks
  • Type: optional

Reference week

Monday, 16h - 18h: Lecture CHB330

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