Electron microscopy: advanced methods

Summary

With this course, the student will learn about advanced methods in transmission electron microscopy, especially what is the electron optical setup involved in the acquisition, and how to interpret the data. After the course, students will be able to understand and assess TEM encountered in papers.

Content

Learning Prerequisites

Required courses

- Electron microscopy : introduction (ideally)
- Basic knowledge of solid state physics, crystallography, crystal defects

Learning Outcomes

By the end of the course, the student must be able to:

• Choose the appropriate TEM technique adapted to their problems
• Recognize the TEM techniques used in a publication
• Interpret TEM data (images, diffraction patterns, chemical analyses)
• Present the TEM results
• Expound on the electron-matter interactions leading to the data

Transversal skills

• Write a scientific or technical report.

Teaching methods

Eight weeks of the course are in a mainly "flipped" format, using MOOC-type online video lectures and quizzes. The remaining weeks use a conventional format. We alternate between the two formats over the semester.

During the "flipped" weeks, students will participate in interative demonstrations at the microscopes, where they can see and practice the techniques discussed in the lectures. They will also have interactive Q&A sessions.

Demos at the microscopes are also given during the "conventional" weeks, to illustrate various more advanced techniques like aberration-corrected imaging.

Expected student activities

Follow the online teaching material *before* attending the TEM session for the 8 weeks of flipped format.

Assessment methods

Project based evaluation with one individual report + oral evaluation during the exam period.

The written report has to be submitted by the second Sunday after the end of teaching. Each student will be individually interviewed based on this report and the full course content during the exam session.

The grade will be 50% written report 50% oral exam.

Resources

Virtual desktop infrastructure (VDI)

No

Bibliography

Transmission Electron Microscopy A Textbook for Materials Science; Williams, David B., Carter, C. Barry

Transmission Electron Microscopy and Diffractometry of Materials; Fultz, Brent, Howe, James

Transmission Electron Microscopy Physics of Image Formation; Reimer, Ludwig, Kohl, Helmut

Ressources en bibliothèque

• Transmission Electron Microscopy A Textbook for Materials Science / Williams, Carter, Barry
• Transmission Electron Microscopy and Diffractometry of Materials; Fultz, Brent, Howe, James
• Transmission Electron Microscopy Physics of Image Formation; Reimer, Ludwig, Kohl, Helmut

Moodle Link

• https://go.epfl.ch/MSE-450