Electron microscopy: advanced methods
Summary
With this course, the student will learn advanced methods in transmission electron microscopy, especially what is the electron optical setup involved in the acquisition, and how to interpret the data. After the course, students will be able to understand and assess TEM encountered in papers.
Content
- Electron imaging and diffraction contrasts
- Phase contrast
- Scanning TEM
- EDS-, EEL-spectroscopy in TEM.
Exercises and demonstrations concerning these themes.
Learning Prerequisites
Required courses
- Electron microscopy : introduction
- Basic knowledge of Solid state physics, Crystallography, Crystal defects
Learning Outcomes
By the end of the course, the student must be able to:
- Choose the appropriate TEM technique adapted to their problems
- Recognize The TEM techniques used in a publication
- Interpret TEM images
- Present the TEM results
Teaching methods
Eight weeks of the course are in a mainly "flipped" format, using MOOC-type online video lectures and quizzes. The remaining weeks use a conventional format. We alternate between the two formats over the semester.
During the "flipped" weeks, students will participate in interative demonstrations at the microscopes, where they can see and practice the techniques discussed in the lectures. They will also have interactive Q&A sessions.
Demos at the microscopes are also given during the "conventional" weeks, to illustrate various more advanced techniques like aberration-corrected imaging.
Expected student activities
Follow the online teaching material *before* attending the TEM session for the 8 weeks of flipped format.
Assessment methods
Project based evaluation with one individual report + oral evaluation during the exam period.
The written report has to be submitted at last, Sunday of the second week after the end of the teachings. Each student will be individually interviewed based on this report during the exam session.
The grade will be 50% written report 50% oral exam.
Resources
Bibliography
Transmission Electron Microscopy
A Textbook for Materials Science
Williams, David B., Carter, C. Barry
Ressources en bibliothèque
Moodle Link
In the programs
- Semester: Spring
- Exam form: Oral (summer session)
- Subject examined: Electron microscopy: advanced methods
- Lecture: 2 Hour(s) per week x 14 weeks
- Exercises: 1 Hour(s) per week x 14 weeks
- Type: optional
- Semester: Spring
- Exam form: Oral (summer session)
- Subject examined: Electron microscopy: advanced methods
- Lecture: 2 Hour(s) per week x 14 weeks
- Exercises: 1 Hour(s) per week x 14 weeks
- Type: optional
- Semester: Spring
- Exam form: Oral (summer session)
- Subject examined: Electron microscopy: advanced methods
- Lecture: 2 Hour(s) per week x 14 weeks
- Exercises: 1 Hour(s) per week x 14 weeks
- Type: optional
- Semester: Spring
- Exam form: Oral (summer session)
- Subject examined: Electron microscopy: advanced methods
- Lecture: 2 Hour(s) per week x 14 weeks
- Exercises: 1 Hour(s) per week x 14 weeks
- Type: optional
- Semester: Spring
- Exam form: Oral (summer session)
- Subject examined: Electron microscopy: advanced methods
- Lecture: 2 Hour(s) per week x 14 weeks
- Exercises: 1 Hour(s) per week x 14 weeks
- Type: optional
- Semester: Spring
- Exam form: Oral (summer session)
- Subject examined: Electron microscopy: advanced methods
- Lecture: 2 Hour(s) per week x 14 weeks
- Exercises: 1 Hour(s) per week x 14 weeks
- Type: optional
- Semester: Spring
- Exam form: Oral (summer session)
- Subject examined: Electron microscopy: advanced methods
- Lecture: 2 Hour(s) per week x 14 weeks
- Exercises: 1 Hour(s) per week x 14 weeks
- Type: optional
Reference week
| Mo | Tu | We | Th | Fr | |
| 8-9 | |||||
| 9-10 | |||||
| 10-11 | |||||
| 11-12 | |||||
| 12-13 | |||||
| 13-14 | |||||
| 14-15 | |||||
| 15-16 | |||||
| 16-17 | |||||
| 17-18 | |||||
| 18-19 | |||||
| 19-20 | |||||
| 20-21 | |||||
| 21-22 |
Légendes:
Lecture
Exercise, TP
Project, labs, other