CH-633 / 2 credits

Teacher(s): Mensi Mounir Driss, Oveisi Emadeddin, Schouwink Pascal Alexander

Language: English

Remark: Next time: Spring 2021


Frequency

Every 2 years

Summary

State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM).

Content

Keywords

Surfaces and solid state characterization, X-ray scattering (GIWAXS, GISAXS),      

spectroscopy (XPS, AES, Raman), microscopy (AFM, TERS, SEM, TEM)

Learning Outcomes

By the end of the course, the student must be able to:

  • Distinguish broad overview of state-of-the-art methods,choosing and designing method and experiment purposefully

Assessment methods

Written

In the programs

  • Exam form: Oral (session free)
  • Subject examined: Advanced Solid State and Surface Characterization
  • Lecture: 28 Hour(s)

Reference week

 MoTuWeThFr
8-9     
9-10     
10-11     
11-12     
12-13     
13-14     
14-15     
15-16     
16-17     
17-18     
18-19     
19-20     
20-21     
21-22