Scanning electron microscopy techniques (a)
MSE-636(a) / 1 credit
Teacher(s): Cantoni Marco, Navratilova Lucie, Oveisi Emadeddin
Language: English
Remark: Next time: October 7-9, 2024
Frequency
Every year
Summary
This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications.
Content
This intensive course is intended for researchers who are potential new users of scanning electron microscopes. It will
provide them with a basic understanding of the instruments, optics of SEM, the imaging modes, the associated analytical
techniques EDS and EBSD, related theories of image formation.
Demonstrations will be given on the microscopes.
2x Year Spring (b) and autumn (a).
Keywords
SEM, FIB, ESEM
Assessment methods
Written
Resources
Websites
Moodle Link
In the programs
- Number of places: 31
- Exam form: Written (session free)
- Subject examined: Scanning electron microscopy techniques (a)
- Lecture: 11 Hour(s)
- Exercises: 1 Hour(s)
- Practical work: 2 Hour(s)
- Type: optional
- Number of places: 31
- Exam form: Written (session free)
- Subject examined: Scanning electron microscopy techniques (a)
- Lecture: 11 Hour(s)
- Exercises: 1 Hour(s)
- Practical work: 2 Hour(s)
- Type: optional