MSE-637(b) / 1 crédit

Enseignant(s): Boureau Victor Carle Adrien, Cantoni Marco, Oveisi Emadeddin

Langue: Anglais


Frequency

Every year

Summary

This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, specimen preparation and high-resolution TEM.

Content

Keywords

TEM, electron diffraction, high-resolution TEM

Learning Prerequisites

Recommended courses

Basic knowledge of crystallography and diffraction is advised

Assessment methods

Written

Resources

Websites

Dans les plans d'études

  • Nombre de places: 26
  • Forme de l'examen: Ecrit (session libre)
  • Matière examinée: Transmission electron microscopy and diffraction (b)
  • Cours: 12 Heure(s)
  • Exercices: 1 Heure(s)
  • TP: 2 Heure(s)

Semaine de référence

Cours connexes

Résultats de graphsearch.epfl.ch.