MSE-659 / 1 crédit

Enseignant(s): Michler Johann, Maeder Xavier

Langue: Anglais

Remark: Course canceled


Every 2 years


Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multimodal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work.


Scanning Electron Microscopy; microanalysis, multimodal imaging, analytical
methods, chemical analysis.

Dans les plans d'études

  • Forme de l'examen: Ecrit (session libre)
  • Matière examinée: Introduction to scanning electron microscopy microanalysis techniques
  • Cours: 15 Heure(s)
  • TP: 3 Heure(s)

Semaine de référence