Introduction to scanning electron microscopy microanalysis techniques
MSE-659 / 1 crédit
Enseignant(s): Michler Johann, Maeder Xavier
Langue: Anglais
Remark: Course canceled
Frequency
Every 2 years
Summary
Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multimodal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work.
Keywords
Scanning Electron Microscopy; microanalysis, multimodal imaging, analytical
methods, chemical analysis.
Dans les plans d'études
- Forme de l'examen: Ecrit (session libre)
- Matière examinée: Introduction to scanning electron microscopy microanalysis techniques
- Cours: 15 Heure(s)
- TP: 3 Heure(s)