MSE-637(b) / 1 credit
This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, specimen preparation and high-resolution TEM.
This intensive course is intended for researchers who are potential new users of transmission electron microscopes for study of materials (i.e. all non-biological) samples. It will provide them with a basic understanding of the instruments, sample requirements, optics of TEM, electron diffraction, the imaging modes, high-resolution TEM, and related theories of image formation.
Demonstrations will be given on the microscopes.
2x Year Spring (b) and autumn (a)
TEM, electron diffraction, high-resolution TEM
Basic knowledge of crystallography and diffraction is advised
In the programs
- Number of places: 26
- Exam form: Written (session free)
- Subject examined: Transmission electron microscopy and diffraction (b)
- Lecture: 14 Hour(s)
- Practical work: 3 Hour(s)