MSE-637(b) / 1 credit

Teacher(s): Cantoni Marco, Oveisi Emadeddin, Boureau Victor Carle Adrien

Language: English


Frequency

Every year

Summary

This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, specimen preparation and high-resolution TEM.

Content

Keywords

TEM, electron diffraction, high-resolution TEM

Learning Prerequisites

Recommended courses

Basic knowledge of crystallography and diffraction is advised

Assessment methods

Written

Resources

Websites

In the programs

  • Number of places: 26
  • Exam form: Written (session free)
  • Subject examined: Transmission electron microscopy and diffraction (b)
  • Lecture: 14 Hour(s)
  • Practical work: 3 Hour(s)

Reference week