Surface analysis
MSE-351 / 3 credits
Teacher(s): Igual Muñoz Anna Neus, Stolichnov Igor
Language: English
Withdrawal: It is not allowed to withdraw from this subject after the registration deadline.
Summary
The course treats the main surface analysis methods for the characterization of surfaces, interfaces and thin films. It discusses how these methods can be applied to gain specific knowledge about structural, chemical and functional properties of surfaces and thin films. Limitation to 18 students!
Content
- Introduction
- Introduction to electronic states on atoms
- Photo Electron Spectroscopy and Chemical Analysis (ESCA/XPS)
- Auger Electron Spectroscopy (AES)
- Secondary Ion Mass Spectrometry (SIMS)
- Depth profiling
- Electron diffraction from surfaces
- Scanning Tunnelling Microscopy (STM)
- Atomic Force Microscopy (AFM)
- Scanning probe techniques based on AFM (MFM, Kelvin probe, PFM, others)
- Quantitative measurements of surface properties with AFM
Keywords
electronic states on atoms, angular momentum, spin, particle wavelength, photoélectrons, energy analyzers, chemical composition, interatomic forces like van der Waal's, surface topography, tunneling effect, local mechanical and piezoelectric responses
Learning Outcomes
By the end of the course, the student must be able to:
- Describe the main features of surface analysis
- Differentiate advantages and disadvantages
- Choose the appropriate methodes
Transversal skills
- Use a work methodology appropriate to the task.
- Access and evaluate appropriate sources of information.
- Evaluate one's own performance in the team, receive and respond appropriately to feedback.
Teaching methods
ex-cathedra and exercises / TP: experimental work with assistants on XPS or AFM in groups of about 4 / presentation on results and interpretation
Expected student activities
learn, look up, make exercises
Assessment methods
written exam
Resources
Bibliography
Leonard C. Feldmann and James W. Mayer, Fundamentals of surface and thin film analysis , North-Holland, (Elsevier) 1986
Hans Jörg Mathieu, Erich Bergmann, and René Gras, Analyse et technologie des surfaces , Presses polytechniques et universitaires romandes, 2003.
D.J. O¿Connor, B.A. Sexton, R.St.C. Smart (eds), Surface analysis methods in materials science , Springer, 2003.
Ressources en bibliothèque
- Analyse et technologies des surfaces / Mathieu
- Surface analysis methods in materials science / Connor
- Fundamentals of surface and thin film analysis / Feldman
Notes/Handbook
copies of foils, script available as pdf file
Moodle Link
In the programs
- Semester: Fall
- Number of places: 18
- Exam form: Written (winter session)
- Subject examined: Surface analysis
- Lecture: 2 Hour(s) per week x 14 weeks
- Practical work: 1 Hour(s) per week x 14 weeks
- Practical work: 1 Hour(s) per week x 14 weeks
- Type: optional
- Semester: Fall
- Number of places: 18
- Exam form: Written (winter session)
- Subject examined: Surface analysis
- Lecture: 2 Hour(s) per week x 14 weeks
- Practical work: 1 Hour(s) per week x 14 weeks
- Practical work: 1 Hour(s) per week x 14 weeks
- Type: optional
- Semester: Fall
- Number of places: 18
- Exam form: Written (winter session)
- Subject examined: Surface analysis
- Lecture: 2 Hour(s) per week x 14 weeks
- Practical work: 1 Hour(s) per week x 14 weeks
- Practical work: 1 Hour(s) per week x 14 weeks
- Type: optional
- Semester: Fall
- Number of places: 18
- Exam form: Written (winter session)
- Subject examined: Surface analysis
- Lecture: 2 Hour(s) per week x 14 weeks
- Practical work: 1 Hour(s) per week x 14 weeks
- Practical work: 1 Hour(s) per week x 14 weeks
- Type: optional