MSE-636(b) / 1 credit

Teacher(s): Cantoni Marco, Oveisi Emadeddin, Navratilova Lucie

Language: English


Frequency

Every year

Summary

This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications.

Content

Keywords

SEM, FIB, ESEM

Assessment methods

Written

In the programs

  • Number of places: 26
  • Exam form: Written (session free)
  • Subject examined: Scanning electron microscopy techniques (b)
  • Lecture: 12 Hour(s)
  • Practical work: 3 Hour(s)

Reference week