MSE-735 / 1 credit

Teacher(s): Boureau Victor Carle Adrien, Cantoni Marco, Oveisi Emadeddin, Reyes Vasquez David Fernando

Language: English


Frequency

Every year

Summary

This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM.

Content

Keywords

Transmission electron microscopy, EDX analysis, EELS

 

Learning Prerequisites

Recommended courses

Doctoral school "Transmission electron microscopy and diffraction"

Resources

Websites

Moodle Link

In the programs

  • Number of places: 30
  • Exam form: Oral presentation (session free)
  • Subject examined: Scanning and Analytical Transmission Electron Microscopy
  • Lecture: 11 Hour(s)
  • Exercises: 3 Hour(s)
  • Practical work: 8 Hour(s)

Reference week

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