Coursebooks

Scanning and Analytical Transmission Electron Microscopy

MSE-735

Lecturer(s) :

Boureau Victor Carle Adrien
Cantoni Marco
Oveisi Emadeddin
Zamani Reza

Language:

English

Frequency

Every 2 years

Summary

This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM.

Content

This intensive course is intended for researchers who are potential new users of transmission electron microscopes and have followed the introductory doctoral course on TEM or have already a good background in conventional transmission electron microscopy. It will provide them with a basic understanding of the methods, relying on an explanation of the physics at play.

 

Demonstrations will be given on the microscopes.

Keywords

Transmission electron microscopy, EDX analysis, EELS

 

Learning Prerequisites

Recommended courses

Doctoral school "Transmission electron microscopy and diffraction"

Resources

Websites

In the programs

Reference week

 
      Lecture
      Exercise, TP
      Project, other

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  • Autumn semester
  • Winter sessions
  • Spring semester
  • Summer sessions
  • Lecture in French
  • Lecture in English
  • Lecture in German