Metrology practicals
MICRO-429 / 2 credits
Teacher(s): Bruschini Claudio, Charbon Edoardo, Fantner Georg
Language: English
Withdrawal: It is not allowed to withdraw from this subject after the registration deadline.
Remark: A suivre uniquement en parallèle de MICRO-428
Summary
The student will get familiar with the techniques learnt in class (MICRO-428) and will put them to practice with experiments in the laboratory. There will be a practical training for each theme covered in class; the students will also learn good practices during measurements.
Content
The topics covered by the course are summarized as follows:
- Dark count rate (DCR) and afterpulsing statistics in photon-counting device
- Sensitivity in photon-counting devices
- Timing jitter measurements in single-photon detectors
- Optical microscope construction and test
- Scanning electron microscopy
- Atomic force microscope
Keywords
SPAD, TCSPC, PDP, PDE, SPTR, CTR, DCR, AFM, SEM, optical microscopy
Learning Prerequisites
Required courses
MICRO-428
Recommended courses
Design of Experiments
Learning Outcomes
- Choose an appropriate measurement methodology
- Develop the understanding of measurement tools and instruments
- Design a measurement experiment
- Interpret measurement results
- Investigate issues related to the accuracy and precision
Assessment methods
Continuous assessment
Resources
Notes/Handbook
Specialized labs
In the programs
- Semester: Spring
- Exam form: During the semester (summer session)
- Subject examined: Metrology practicals
- Practical work: 2 Hour(s) per week x 14 weeks
- Semester: Spring
- Exam form: During the semester (summer session)
- Subject examined: Metrology practicals
- Practical work: 2 Hour(s) per week x 14 weeks