Metrology
MICRO-428 / 3 credits
Teacher(s): Bruschini Claudio, Charbon Edoardo, Fantner Georg
Language: English
Summary
The course deals with the concept of measuring in different domains, particularly in the electrical, optical, and microscale domains. The course will end with a perspective on quantum measurements, which could trigger the ultimate revolution in metrology.
Content
The course deals with the concept of measuring in different domains, particularly in the electrical, optical, and microscale domains. The concept of precision, accuracy, and resolution will be introduced early in the course with an embedded course on statistics, which provides the basics required to understand how proper measurements ought to be performed. Subsequently, the course will introduce electrical, optical, and mechanical metrology techniques dealing with intrinsic and extrinsic limitations of the measurement. The course will end with a perspective on quantum measurements, which could trigger the ultimate revolution in metrology. Homework will be used as a means to practice the concepts learnt in class.
Syllabus
- Classical metrology
- Basic statistics
- Electrical metrology
- Optical microscopy
- Optical imaging
- AFM
- SEM
- Quantum metrology
Keywords
Accuracy, precision, resolution, reproducibility, reliability, fidelity of the measurement
Learning Prerequisites
Required courses
Basic mathematics/physics
Recommended courses
Design of experiments
Learning Outcomes
By the end of the course, the student must be able to:
- Develop measurement setups that yield reproducible results
- Analyze the accuracy and precision of a measurement for a certain resolution
- Interpret the quality of data from measurements
Transversal skills
- Demonstrate the capacity for critical thinking
Teaching methods
Ex cathedra, exercises and homeworks. Q&A during lectures.
Expected student activities
In-class presence and active participation strongly encouraged.
Assessment methods
Self-assessment (ungraded homework, exercise session); final exam during exam sessions.
Supervision
| Office hours | Yes |
| Assistants | Yes |
Resources
Notes/Handbook
On Moodle: handouts of current year and recordings of all previous lectures.
Moodle Link
Prerequisite for
MICRO-429 Metrology Practicals
In the programs
- Semester: Spring
- Exam form: Written (summer session)
- Subject examined: Metrology
- Lecture: 3 Hour(s) per week x 14 weeks
- Semester: Spring
- Exam form: Written (summer session)
- Subject examined: Metrology
- Lecture: 3 Hour(s) per week x 14 weeks
- Semester: Spring
- Exam form: Written (summer session)
- Subject examined: Metrology
- Lecture: 3 Hour(s) per week x 14 weeks
- Semester: Spring
- Exam form: Written (summer session)
- Subject examined: Metrology
- Lecture: 3 Hour(s) per week x 14 weeks
- Semester: Spring
- Exam form: Written (summer session)
- Subject examined: Metrology
- Lecture: 3 Hour(s) per week x 14 weeks
- Semester: Spring
- Exam form: Written (summer session)
- Subject examined: Metrology
- Lecture: 3 Hour(s) per week x 14 weeks
Reference week
| Mo | Tu | We | Th | Fr | |
| 8-9 | |||||
| 9-10 | |||||
| 10-11 | |||||
| 11-12 | |||||
| 12-13 | |||||
| 13-14 | |||||
| 14-15 | |||||
| 15-16 | |||||
| 16-17 | |||||
| 17-18 | |||||
| 18-19 | |||||
| 19-20 | |||||
| 20-21 | |||||
| 21-22 |
Légendes:
Lecture
Exercise, TP
Project, other