Coursebooks

Introduction to scanning electron microscopy microanalysis techniques

MSE-659

Lecturer(s) :

Maeder Xavier
Michler Johann

Language:

English

Frequency

Every 2 years

Remark

Next time: November 2021

Summary

Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multimodal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work.

Content

Please find information on the link : https://www.epfl.ch/research/domains/ccmx/courses-and-events/sem2019/


Keywords

Scanning Electron Microscopy; microanalysis, multimodal imaging, analytical
methods, chemical analysis.

Resources

Websites

In the programs

Reference week

 
      Lecture
      Exercise, TP
      Project, other

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  • Autumn semester
  • Winter sessions
  • Spring semester
  • Summer sessions
  • Lecture in French
  • Lecture in English
  • Lecture in German