MSE-659 / 1 credit

Teacher(s): Michler Johann, Maeder Xavier

Language: English

Remark: Next time: November 2021


Frequency

Every 2 years

Summary

Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multimodal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work.

Keywords

Scanning Electron Microscopy; microanalysis, multimodal imaging, analytical
methods, chemical analysis.

In the programs

  • Exam form: Written (session free)
  • Subject examined: Introduction to scanning electron microscopy microanalysis techniques
  • Lecture: 9 Hour(s)
  • Exercises: 8 Hour(s)

Reference week

 MoTuWeThFr
8-9     
9-10     
10-11     
11-12     
12-13     
13-14     
14-15     
15-16     
16-17     
17-18     
18-19     
19-20     
20-21     
21-22