MSE-659 / 1 credit

Teacher(s): Michler Johann, Maeder Xavier

Language: English

Remark: Course canceled


Every 2 years


Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multimodal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work.


Scanning Electron Microscopy; microanalysis, multimodal imaging, analytical
methods, chemical analysis.

In the programs

  • Exam form: Written (session free)
  • Subject examined: Introduction to scanning electron microscopy microanalysis techniques
  • Lecture: 15 Hour(s)
  • Practical work: 3 Hour(s)

Reference week