MSE-659 / 1 credit
Remark: Course canceled
Every 2 years
Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multimodal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work.
Scanning Electron Microscopy; microanalysis, multimodal imaging, analytical
methods, chemical analysis.
In the programs
- Exam form: Written (session free)
- Subject examined: Introduction to scanning electron microscopy microanalysis techniques
- Lecture: 15 Hour(s)
- Practical work: 3 Hour(s)