MSE-628 / 1 credit
Remark: Next time: 2021
Every 2 years
After introducing thin film and HR-XRD characterisation methods, theory and limitations are discussed, including examples and how the film structure influences its characteristics. Protocols are presented for establishing reproducible and reliable measurements, and for interpreting their results.
Please find information on the link below.
In the programs
- Exam form: Written (session free)
- Subject examined: CCMX Advanced Course - Advanced X-ray Diffraction Methods for Coatings: strain, defects and deformation analysis of thin films
- Lecture: 13 Hour(s)
- Practical work: 5 Hour(s)