MSE-628 / 1 credit

Teacher(s): Dommann Alex, Neels Antonia

Language: English

Remark: Next time: 2021


Frequency

Every 2 years

Summary

After introducing thin film and HR-XRD characterisation methods, theory and limitations are discussed, including examples and how the film structure influences its characteristics. Protocols are presented for establishing reproducible and reliable measurements, and for interpreting their results.

Content

In the programs

  • Exam form: Written (session free)
  • Subject examined: CCMX Advanced Course - Advanced X-ray Diffraction Methods for Coatings: strain, defects and deformation analysis of thin films
  • Lecture: 13 Hour(s)
  • Practical work: 5 Hour(s)

Reference week

 MoTuWeThFr
8-9     
9-10     
10-11     
11-12     
12-13     
13-14     
14-15     
15-16     
16-17     
17-18     
18-19     
19-20     
20-21     
21-22