Advanced Microscopy for Materials
MSE-677 / 2 credits
Teacher(s): Herrmann Lorenz, Maeder Xavier, Michler Johann, Putz Barbara
Language: English
Remark: Students should register on the https://www.epfl.ch/research/domains/ccmx/ website
Frequency
Every year
Summary
This course provides an overview of advanced materials characterization techniques, focusing on modern Scanning Electron Microscopy (SEM) combined with Focused Ion Beam (FIB) systems (dual-beam), as well as Transmission Electron Microscopy (TEM) and Atom Probe Tomography (APT).
Content
This course provides an overview of advanced materials characterization techniques, focusing on modern Scanning Electron Microscopy (SEM) combined with Focused Ion Beam (FIB) systems (dual-beam), as well as Transmission Electron Microscopy (TEM) and Atom Probe Tomography (APT).
These techniques enable multimodal imaging and a wide range of analytical methods, which will be discussed and compared in terms of their capabilities for both elemental and structural characterization.
The course aims to introduce the fundamental principles behind each technique, present their characterization possibilities, and demonstrate how their combined use can provide a deeper and more comprehensive understanding of materials.
Keywords
Advanced Microscopy, Materials
Assessment methods
Written exam
In the programs
- Number of places: 16
- Exam form: Written (session free)
- Subject examined: Advanced Microscopy for Materials
- Courses: 30 Hour(s)
- TP: 2 Hour(s)
- Type: optional