3D Electron Microscopy and FIB-Nanotomography

MSE-704 / 1 credit

Teacher(s): Cantoni Marco, Navratilova Lucie

Language: English

Frequency

Every year

Summary

The principles of 3D surface (SEM) reconstruction and its limitations will be explained. 3D volume reconstruction and tomography methods by electron microscopy (SEM/FIB and TEM) will be explained and compared with x-ray tomography.

Content

Physics of the different signals generated by electron beams and focused ion beams.

  • Underlying physical principles for the acquisition of data sets for 3D reconstruction: interaction volumes, voxel (3 dimensional "pixel") size, mechanical stability issues for successful recon-struction.
  • surface reconstruction (SEM), serial (parallel) sectioning (SEM/FIB and TEM), tilt series tomo-graphy (TEM)
  • introduction to the use of software packages for 3D surface and volume reconstruction
  • practical session about the 3D surface reconstruction by SEM
  • practical session about 3D volume reconstruction by FIB nano-tomography
  • practical session TEM tomography

     

 

Keywords

3D reconstruction, serial sectioning, electron tomography, FIB Nano-tomography, scanning electron microscopy, transmission electron microscopy

Learning Prerequisites

Recommended courses

background in electron microscopy: electron microscopy lecture 5 sem. Bachelor level or doctoral school SEM&TEM or equivalent

Assessment methods

Project Report

Resources

Moodle Link

In the programs

  • Number of places: 15
  • Exam form: Project report (session free)
  • Subject examined: 3D Electron Microscopy and FIB-Nanotomography
  • Courses: 8 Hour(s)
  • Exercises: 4 Hour(s)
  • TP: 2 Hour(s)
  • Type: optional

Reference week

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