3D Electron Microscopy and FIB-Nanotomography
MSE-704 / 1 credit
Teacher(s): Cantoni Marco, Navratilova Lucie
The principles of 3D surface (SEM) reconstruction and its limitations will be explained. 3D volume reconstruction and tomography methods by electron microscopy (SEM/FIB and TEM) will be explained and compared with x-ray tomography.
Physics of the different signals generated by electron beams and focused ion beams.
- Underlying physical principles for the acquisition of data sets for 3D reconstruction: interaction volumes, voxel (3 dimensional "pixel") size, mechanical stability issues for successful recon-struction.
- surface reconstruction (SEM), serial (parallel) sectioning (SEM/FIB and TEM), tilt series tomo-graphy (TEM)
- introduction to the use of software packages for 3D surface and volume reconstruction
- practical session about the 3D surface reconstruction by SEM
- practical session about 3D volume reconstruction by FIB nano-tomography
- practical session TEM tomography
3D reconstruction, serial sectioning, electron tomography, FIB Nano-tomography, scanning electron microscopy, transmission electron microscopy
background in electron microscopy: electron microscopy lecture 5 sem. Bachelor level or doctoral school SEM&TEM or equivalent
In the programs
- Exam form: Project report (session free)
- Subject examined: 3D Electron Microscopy and FIB-Nanotomography
- Lecture: 8 Hour(s)
- Exercises: 4 Hour(s)
- Practical work: 2 Hour(s)