MSE-704 / 1 credit

Teacher(s): Cantoni Marco, Navratilova Lucie

Language: English


Frequency

Every year

Summary

The principles of 3D surface (SEM) reconstruction and its limitations will be explained. 3D volume reconstruction and tomography methods by electron microscopy (SEM/FIB and TEM) will be explained and compared with x-ray tomography.

Content

Keywords

3D reconstruction, serial sectioning, electron tomography, FIB Nano-tomography, scanning electron microscopy, transmission electron microscopy

Learning Prerequisites

Recommended courses

background in electron microscopy: electron microscopy lecture 5 sem. Bachelor level or doctoral school SEM&TEM or equivalent

Assessment methods

Project Report

In the programs

  • Exam form: Project report (session free)
  • Subject examined: 3D Electron Microscopy and FIB-Nanotomography
  • Lecture: 11 Hour(s)
  • Practical work: 3 Hour(s)

Reference week