Fiches de cours 2017-2018

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CCMX Advanced Course - Atomic Force Microscopy (AFM): Theory and Practice

MSE-624

Lecturer(s) :

Bernard Laetitia
Hug Hans Josef
Mueller Daniel

Language:

English

Remarque

Postponed until further notice

Summary

The course features a theoretical introduction to Atomic Force Microscopy techniques and hands-on training for all levels of experience, from beginners to more advanced users.

Content

Please find the information on the following link :

http://www.ccmx.ch/courses-and-events/news-single/article/189/60/

Note

Please register with CCMX

Keywords

Atomic Force Microscopy, Scanning Force Microscopy, contact mode, intermittent contact
mode, peak force mode, true non-contact mode in vacuum.

 

Learning Prerequisites

Recommended courses

materials sciences, physics, chemistry

Assessment methods

Oral exam

Resources

Websites

In the programs

Reference week

 
      Lecture
      Exercise, TP
      Project, other

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  • Autumn semester
  • Winter sessions
  • Spring semester
  • Summer sessions
  • Lecture in French
  • Lecture in English
  • Lecture in German