Fiches de cours 2017-2018

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CCMX Advanced Course - Advanced X-ray Diffraction Methods for Coatings: strain, defects and deformation analysis of thin films

MSE-628

Lecturer(s) :

Dommann Alex
Neels Antonia

Language:

English

Frequency

Every 2 years

Remarque

Next time: 27-29 novembre 2017 at Empa, Dübendorf

Summary

After introducing thin film and HR-XRD characterisation methods, theory and limitations are discussed, including examples and how the film structure influences its characteristics. Protocols are presented for establishing reproducible and reliable measurements, and for interpreting their results.

Content

http://www.ccmx.ch/courses-and-events/article/2017/05/ccmx-advanced-course-advanced-x-ray-diffraction-methods-for-coatings/

 

 

 

Resources

Websites

In the programs

    • Semester
    • Exam form
       Written
    • Credits
      1
    • Subject examined
      CCMX Advanced Course - Advanced X-ray Diffraction Methods for Coatings: strain, defects and deformation analysis of thin films
    • Lecture
      13 Hour(s)
    • Practical work
      5 Hour(s)

Reference week

 
      Lecture
      Exercise, TP
      Project, other

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  • Autumn semester
  • Winter sessions
  • Spring semester
  • Summer sessions
  • Lecture in French
  • Lecture in English
  • Lecture in German