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Coursebooks 2017-2018
Transmission electron microscopy and diffraction (b)
MSE-637(b)
Lecturer(s) :
Alexander DuncanDeiana Davide
La Grange Thomas
Laub Danièle
Language:
English
Frequency
Every yearSummary
This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, specimen preparation and high-resolution TEM.Content
This intensive course is intended for researchers who are potential new users of transmission electron microscopes for study of materials (i.e. all non-biological) samples. It will provide them with a basic understanding of the instruments, sample requirements, optics of TEM, electron diffraction, the imaging modes, high-resolution TEM, and related theories of image formation.
Demonstrations will be given on the microscopes.
2x Year Spring (b) and autumn (a)
Keywords
TEM, electron diffraction, high-resolution TEM
Learning Prerequisites
Recommended courses
Basic knowledge of crystallography and diffraction is advised
Assessment methods
Written
Resources
Websites
In the programs
- Semester
- Exam form
Written - Credits
1 - Subject examined
Transmission electron microscopy and diffraction (b) - Lecture
12 Hour(s) - Exercises
1 Hour(s) - Practical work
3 Hour(s)
- Semester
Reference week
Lecture
Exercise, TP
Project, other
legend
- Autumn semester
- Winter sessions
- Spring semester
- Summer sessions
- Lecture in French
- Lecture in English
- Lecture in German